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Time-resolved imaging of the microbunching instability and energy spread at the Linac Coherent Light Source

机译:直线加速器相干光源在微束不稳定性和能量扩散方面的时间分辨成像

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摘要

The microbunching instability (MBI) is a well-known problem for high brightness electron beams and has been observed at accelerator facilities around the world. Free-electron lasers (FELs) are particularly susceptible to MBI, which can distort the longitudinal phase space and increase the beam’s slice energy spread (SES). Past studies of MBI at the Linac Coherent Light Source (LCLS) relied on optical transition radiation to infer the existence of microbunching. With the development of the x-band transverse deflecting cavity (XTCAV), we can for the first time directly image the longitudinal phase space at the end of the accelerator and complete a comprehensive study of MBI, revealing both detailed MBI behavior as well as insights into mitigation schemes. The fine time resolution of the XTCAV also provides the first LCLS measurements of the final SES, a critical parameter for many advanced FEL schemes. Detailed MBI and SES measurements can aid in understanding MBI mechanisms, benchmarking simulation codes, and designing future high-brightness accelerators.
机译:对于高亮度电子束,微束不稳定性(MBI)是一个众所周知的问题,并且已在世界各地的加速器设施中观察到。自由电子激光器(FEL)特别容易受到MBI的影响,MBI会使纵向相空间扭曲并增加光束的切片能量散布(SES)。过去在直线加速器相干光源(LCLS)上对MBI的研究依赖于光学跃迁辐射来推断微束的存在。随着X波段横向偏转腔(XTCAV)的发展,我们可以首次直接对加速器末端的纵向相空间进行成像,并完成MBI的全面研究,从而揭示MBI的详细行为和见解纳入缓解计划。 XTCAV的精细时间分辨率还提供了最终SES的首次LCLS测量,这是许多高级FEL方案的关键参数。详细的MBI和SES测量可以帮助理解MBI机制,对模拟代码进行基准测试以及设计未来的高亮度加速器。

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